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SIS-5100 optical waveguide spectrometer
Optical waveguide spectroscopy is an important absorption spectrum for measuring sample surfaces and interfaces. The SIS-5100 optical waveguide spectr
Product details
Optical waveguide spectroscopy is an important absorption spectrum for measuring sample surfaces and interfaces. The SIS-5100 optical waveguide spectrometer can provide a new solution for your optical waveguide spectroscopy measurement. The SIS-5100 optical waveguide spectrometer has reached a new level of development in terms of detection sensitivity, information acquisition, and ease of operation.
- High sensitivity (trace samples, thin film samples, weak absorption samples)
- Real time measurement (detecting reaction progress and molecular response changes)
- Can be performed simultaneously with other tests (surface plasmon resonance, fluorescence, electrochemistry)
Optical waveguide spectroscopy
The SIS-5100 optical waveguide spectrometer is developed based on optical waveguide spectroscopy technology. SIS-5100 utilizes the repeated reflection of evanescent waves to measure the absorption spectra of ultra-thin and weakly absorbing thin films, with high sensitivity, which is difficult to measure with traditional UV/visible spectrophotometers.
The thin films (samples) used for organic EL and organic thin-film solar cells are generally as thin as tens to hundreds of nanometers, so their absorbance is very small, to the point where traditional spectrophotometers cannot detect them. In most cases, it is difficult to measure because it cannot be detected.
Therefore, when measuring such samples with a general spectrophotometer, it is necessary to process the sample, such as increasing the thickness of the sample to increase absorption, so that the measurement can be made. However, increasing the thickness will cause the thickness of the sample to be different from the actual thickness of the sample used, and the properties of the thickened sample may be different from those of the thin film state sample, so it is very likely that accurate measurements cannot be obtained.
For SIS-5100, it uses optical waveguide spectroscopy to measure the absorption spectrum of a thin film sample placed on a dedicated optical waveguide (without any thickness adjustment). In theory, when white light is incident on a quartz waveguide (wafer) from one side, it will repeatedly reflect and generate evanescent waves. By detecting the evanescent waves, high-sensitivity measurements can be achieved
Because the thickness of the sample is very thin, it can be understood that the measured absorption spectrum is in the transverse direction (distance) of the sample.
In addition, because SIS-5100 can use multi-channel real-time measurement of absorption spectra, it can also evaluate changes in electrochemical absorption spectra.
For example, if power is applied at a specific time, the changes in absorption spectra can be checked in real time compared to when power is not applied. For traditional spectrophotometers, the light absorption of thin films is very small, and even for real-time detection, the change in light absorption after power on is also very small, making it impossible to detect. By using the highly sensitive SIS-5100, this can be measured.
Similarly, the above refers to measuring the absorption changes of the sample after being electrified. We can measure the changes in absorption spectra of a sample after adding a certain liquid in the same way. Real time measurement of absorption spectra can be achieved by adding reagents at a certain time and observing subsequent changes in absorption spectra, which is necessary for applications in the field of biology.
Of course, it is also possible to irradiate the sample with light for a certain period of time and then measure the changes in the absorption spectrum.
The feature of SIS-5100 is that it can measure ultra-thin thin films and weakly absorbing thin film samples with extremely low light absorption with high sensitivity using evanescent waves.
Especially for samples where the thickness of the film is difficult to change (samples where the material cannot be thickened or thickening will cause changes in the properties of the sample) and samples where the thickness of the film cannot be increased (such as samples where the thickness of the biofilm cannot be controlled), the performance advantages of SIS-5100 can be maximized, which is the unique feature of SIS-5100.
Real time analysis, surface and interface analysis
Nanotechnology for machine parts is available
Molecular Range Structure Analysis of Organic Electroluminescence
Dye sensitized solar cells
Functional analysis of molecules in photothermal induction and light depletion
Biosensors and Functional Analysis
Surface plasmon resonance for affinity analysis of biomolecules
Simultaneous measurement and analysis of L and electrochemistry
Using a linearly polarized light source for molecular orientation analysis
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